describe how we use V protocol aware solution to test a complex RF device. form reconstruction utilizes the coherency of V SOC system to. Download scientific diagram | Agilent SOC Series tester. from publication: Test engineering education in Europe: the EuNICE-Test project | The paper. Download scientific diagram | Agilent SOC Series Digital IC Test System from publication: Process Models for the Reconstruction of Software Architecture .
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The value of parallel test, however, depends on its efficiency.
Product Summary Per-pin scalability up to Mbps High density digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production.
This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds.
Flexible waveform generation for high-speed applications. This flexibility can be especially important for embedded memory, microprocessor and protocol-based communications applications. Compatible with Agilent Ce-channels Protects your investment in equipment, people and training Additional Detail Up to pins The Pin Scale offers 32 pins per card, which is twice the density of the Ce- and P-model digital cards.
The entire amount of purchased memory is available for both test vectors and sequencer instructions, which provides more flexibility than architectures based upon two unshared memory areas. Per-pin software licenses for speed and memory depth mean you add just the performance you need, when you need 93000.
Agilent 93000 Pin Scale 800
Each pin of the Pin Scale can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match device requirements, pin-by-pin.
And this must all be done at a lower costof-test than last year because of ongoing price erosion. Provides performance for high speed interface test, such as DDR, operating over Mbps.
As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment. Unified memory approach The entire amount of purchased memory is available for both test vectors and sequencer instructions for maximum flexibility.
Per-pin scalability from to Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost.
Agilent InstaPin also maximizes agilrnt utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor or different production facilities around the world. Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors.
For printed directions on Preparing for Registration. Agilent Pin Scale Product Overview Industry Challenges Consumer demand for more capability and connectivity in a single product is driving the need for more functionality, faster processing and higher speed agient in next-generation System-on-a-Chip SOC and System-in-Package SIP devices. The Pin Scale features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel across pins, providing 9300 parallel efficiency.
Because the reconfiguration is accomplished via software, no hardware is moved, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement.
Agilent CE for sale / JMC Worldwide Inc.
Per-pin speed scalability from Mbps to Mbps provides the performance needed to test a wide range of interfaces, including USB2. This results in minimal aiglent overhead and higher throughput. Optional waveforms Provides greater timing flexibility for ease of programming. This enables the Agilent to offer the following pin counts: Reconfiguration is done instantly when the test program is loaded, ensuring no downtime. Each pin operates independently, enabling parallel processing for maximum multi-site efficiency.
Test Processor-Per-Pin architecture Localizing all test processing instead of using centralized resources results in minimal measurement overhead and higher throughput. An uncertain future demands the ability to upgrade quickly to meet 930000 next performance challenge while continuing to reduce cost-of-test.
Agilent Pin Scale
Up to pins Support of multi-site for high pin count devices reduces cost-of-test. This lowers immediate capital investment and provides for future growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds. Available per-pin licenses for memory depth: Business Finance Agilent Pin Scale advertisement. With per-pin licenses to enable the different speed and memory performance levels — part of the industry-first Agilent InstaPin performance library — the Pin Scale digital card can be configured to match the device requirements, pin-by-pin, resulting in the agklent cost of test.
Testing in higher x-modes means that more logical vector memory is available. agjlent
Also beneficial to generate low jitter high-speed clock signals. The Pin Scale protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future.
To test these devices, a test system must have the capability to address a range of performance challenges: